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2016/17 Taught Postgraduate Module Catalogue

ELEC5200M Next Generation Silicon Technologies

15 creditsClass Size: 40

Module manager: Dr R.W. Kelsall
Email: r.w.kelsall@leeds.ac.uk

Taught: Semester 2 (Jan to Jun) View Timetable

Year running 2016/17

This module is not approved as an Elective

Objectives

On completion of this module, students should be able to:

- demonstrate an understanding of the key processes involved in silicon integrated circuit fabrication;
- demonstrate the physical, materials and engineering issues which must be addressed to ensure future progress in this technology;
- demonstrate the manufacturing solutions proposed or under development in each case.

Syllabus

- Silicon microfabrication techniques: crystal growth, oxidation, lithography, doping, metallisation and interconnects, wire bonding.
- Design rules; scaling rules; yield modelling.
- Revision of MOSFET operation and connection with processing requirements.
- Moore's Law: trends in silicon integrated circuit performance and manufacturing over 5 decades.
- Next generation issues: overview of the International Technology Roadmap for Semiconductors; advanced and alternative lithography methods; self-heating, heat dissipation and thermal management; issues for continued scaling of the device active region, including short channel effects, new materials and new geometries; gate stack design; and advancements in metallisation and interconnects.

Teaching methods

Delivery typeNumberLength hoursStudent hours
Lecture62.0012.00
Seminar52.0010.00
Private study hours128.00
Total Contact hours22.00
Total hours (100hr per 10 credits)150.00

Private study

- Backround reading and preparation for seminars.
- Preparation for the essay and presentation.
- Revision for exam.

Opportunities for Formative Feedback

Student progress will be monitored during the 5 x 2 hour seminars.

Methods of assessment


Coursework
Assessment typeNotes% of formal assessment
Essay.25.00
Presentation.25.00
Total percentage (Assessment Coursework)50.00

Normally resits will be assessed by the same methodology as the first attempt, unless otherwise stated


Exams
Exam typeExam duration% of formal assessment
Standard exam (closed essays, MCQs etc)3 hr 50.00
Total percentage (Assessment Exams)50.00

Normally resits will be assessed by the same methodology as the first attempt, unless otherwise stated

Reading list

The reading list is available from the Library website

Last updated: 17/08/2015

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