2022/23 Taught Postgraduate Module Catalogue
JACO0002 Advanced Characterisation Techniques
12 creditsClass Size: 20
Module manager: Professor Bruno Trindade
Email: bruno.trindade@dem.uc.pt
Taught: Semester 1 (Sep to Jan) View Timetable
Year running 2022/23
Pre-requisite qualifications
Min 2(i) Engineering or Physical SciencesThis module is not approved as an Elective
Module summary
Objectives
The objective of this course is to give the students skills in advanced methods for materials characterization in order that that they can select the most suitable one for a specific property as, for example, the in depth characterization of a material at a nanometric level. For that, the students have access to the available testing equipment’s in UC, to perform several practical and laboratorial works which will be presented as scientific and technical reports. The experimental skills of the students in performing research work are also goals to be achieved in this course.Skills outcomes
Analysis and synthesis
Information Management
Problems resolution
Ability to work in a group
Ability to apply in practical situations the theory
Syllabus
1. Physical-chemical Methods:
1.1 Electron Probe Microanalyses (EPMA): Basic principles; technical aspects; qualitative and quantitative analyses; ZAF and PAP corrections.
1.2 X-ray photoelectron spectroscopy (XPS): Basic principles and theory; the photoelectric effect; photoionisation cross-sections; chemical shifts; inelastic scattering and sampling depth; technical details; analytical procedures and qualitative interpretation; quantitative surface analysis.
1.3 AUGER Electron Spectroscopy (AES): basic principles and theory; electron scattering; special resolution; instrumentation; data acquisition; quantitative analysis; practical aspects
1.4 Secondary ion mass spectroscopy (SIMS): Basic principles; mechanism of secondary ion emission; experimental parameters; instrumentation; data acquisition
1.5 RAMAN Spectroscopy: Basic principles; experimental parameters; instrumentation; data acquisition; applications
1.6 Rutherford Backscattering (RBS): Basic principles; experimental parameters; instrumentation; data acquisition; applications.
2. Structure Analysis Methods:
2.1 X-ray diffraction (XRD)L Theory of diffraction; experimental methods with incident parallel beam: Debye-Sherrer; rotating crystal and four circles methods; Bragg-Brentano and Seeman-Bohlin; lattice parameter; crystallinity; residual stress measurements; quantitative analysis of phases; micro diffraction; grazing diffraction; small angle diffraction.
2.2 X-ray Tomography: Basic principles; experimental parameters; instrumentation; data acquisition; applications.
2.3 Scanning Electron Microscopy (SEM): Physical principles (elastic and inelastic diffusion, back scattering); experimental parameters, instrumentation; data acquisition; analytical applications.
2.4 Transmission electron microscopy (TEM): basic principle; preparation of the samples; image and diffraction modes; quantitative analysis; HRTEM images; improvement of resolution by aberration correction.
Teaching methods
| Delivery type | Number | Length hours | Student hours |
| Lecture | 30 | 1.00 | 30.00 |
| Practical | 15 | 1.00 | 15.00 |
| Seminar | 15 | 1.00 | 15.00 |
| Tutorial | 10 | 1.00 | 10.00 |
| Private study hours | 50.00 | ||
| Total Contact hours | 70.00 | ||
| Total hours (100hr per 10 credits) | 120.00 | ||
Methods of assessment
Coursework
| Assessment type | Notes | % of formal assessment |
| Fieldwork | . | 50.00 |
| Total percentage (Assessment Coursework) | 50.00 | |
Normally resits will be assessed by the same methodology as the first attempt, unless otherwise stated
Exams
| Exam type | Exam duration | % of formal assessment |
| Standard exam (closed essays, MCQs etc) | 0 hr | 50.00 |
| Total percentage (Assessment Exams) | 50.00 | |
Normally resits will be assessed by the same methodology as the first attempt, unless otherwise stated
Reading list
There is no reading list for this moduleLast updated: 29/04/2022 15:31:26
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